Design of Single Electron (SEEL) Encoded Logic Based Hamming Code IC

نویسندگان

  • Dr. J. Gope
  • S. Chakraborty
  • I. Misra
  • R. Mandal
  • T. Chatterjee
چکیده

Digital information system do poses errors, these errors are the consequence of path delay in communication system as some sort of errored signal processing to achieve an error free information. Error detection circuits are pivoted several tropology’s are being implied since the last three decade. In the past CMOS era we see how single electron transistor are incorporated to achieve error free signal. The authors in this article uses Single Electron encoded logic (SEEL) to detect possible error using hamming code and use the same process to multiply the error with maximum speed. The resultant circuit is unique of its kind as SEEL Based Hamming Code is yet to be used profoundly. KeywordsCMOS, Digital information, Errors, Hamming Code, Path Delay, SEEL.

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تاریخ انتشار 2016